"Fast Surface Defect Detection Using Improved Gabor Filters."

Jiaxu Ma et al. (2018)

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DOI: 10.1109/ICIP.2018.8451351

access: closed

type: Conference or Workshop Paper

metadata version: 2018-09-11

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Jiaxu Ma, Yuxi Wang, Chen Shi, Cewu Lu:
Fast Surface Defect Detection Using Improved Gabor Filters. ICIP 2018: 1508-1512

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