"Pattern Recognition and Artificial Intelligence - International ..."

Yue Lu et al. (2020)

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DOI: 10.1007/978-3-030-59830-3

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type: Editorship

metadata version: 2023-01-12

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Yue Lu, Nicole Vincent, Pong Chi Yuen, Wei-Shi Zheng, Farida Cheriet, Ching Y. Suen:
Pattern Recognition and Artificial Intelligence - International Conference, ICPRAI 2020, Zhongshan, China, October 19-23, 2020, Proceedings. Lecture Notes in Computer Science 12068, Springer 2020, ISBN 978-3-030-59829-7 [contents]

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