"New Insights into TDDB in FinFET Based on Strain Analysis at the Atomistic ..."

Zuoyuan Dong et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983565

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Zuoyuan Dong, Zixuan Sun, Lan Li, Zirui Wang, Changqing Ye, Yu Yao, Jialu Huang, Xiaomei Li, Xing Wu, Runsheng Wang:
New Insights into TDDB in FinFET Based on Strain Analysis at the Atomistic Scale. IRPS 2025: 1-4

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