"Advanced Characterization of p/n Junctions in SiC."

G. Johnson et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983727

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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G. Johnson, A Rummel, H. Stegmann, P. Barbarino, C. Poltronieri, G. Sciuto, M. Astuto, Giancarlo Calvagno, R. Ricciari:
Advanced Characterization of p/n Junctions in SiC. IRPS 2025: 1-3

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