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"Nanosecond-scale and self-heating free characterization of advanced CMOS ..."

Wei Liu et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405218

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Wei Liu, Yaru Ding, Liang Zhao, Yi Zhao:
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection. IRPS 2021: 1-5

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