"Reliability Characterization for 12 V Application Using the 22FFL FinFET ..."

Chen-Yi Su et al. (2020)

> Home

Details and statistics

DOI: 10.1109/IRPS45951.2020.9128314

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/SuACEGLMOPPPRWY20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/SuACEGLMOPPPRWY20
Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young:
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. IRPS 2020: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.