"Reliability and Robustness Performance of 1200 V SiC DMOSFETs."

Siddarth Sundaresan et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128225

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Siddarth Sundaresan, Vamsi Mulpuri, Jaehoon Park, Ranbir Singh:
Reliability and Robustness Performance of 1200 V SiC DMOSFETs. IRPS 2020: 1-4

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