"Fast implementation of a linearity test approach for high-resolution ADCs ..."

Le Jin et al. (2004)

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type: Conference or Workshop Paper

metadata version: 2022-07-26

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Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935

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