"Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies."

Joseph Shor, Kosta Luria, Dror Zilberman (2012)

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DOI: 10.1109/ISSCC.2012.6176979

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Joseph Shor, Kosta Luria, Dror Zilberman:
Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies. ISSCC 2012: 210-212

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