"Temporal Performance Degradation under RTN: Evaluation and Mitigation for ..."

Hong Luo et al. (2012)

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DOI: 10.1109/ISVLSI.2012.35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hong Luo, Yu Wang, Yu Cao, Yuan Xie, Yuchun Ma, Huazhong Yang:
Temporal Performance Degradation under RTN: Evaluation and Mitigation for Nanoscale Circuits. ISVLSI 2012: 183-188

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