"Automatic Test Program Generation for Transition Delay Faults in Pipelined ..."

Kai-Hsun Chen et al. (2021)

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DOI: 10.1109/ITC-ASIA53059.2021.9808811

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-15

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Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang:
Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. ITC-Asia 2021: 1-6

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