"Use Machine Learning Based Smart Sampling to Improve System Level Testing ..."

Chenwei Liu, Jie Ou (2021)

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DOI: 10.1109/ITC-ASIA53059.2021.9808718

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-15

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Chenwei Liu, Jie Ou:
Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency. ITC-Asia 2021: 1-6

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