"On Test Pattern Generation Method for an Approximate Multiplier ..."

Shogo Tokai et al. (2023)

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DOI: 10.1109/ITC-ASIA58802.2023.10301158

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-15

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Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume:
On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults. ITC-Asia 2023: 1-6

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