"An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and ..."

Yongquan Fan et al. (2006)

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DOI: 10.1109/TEST.2006.297721

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar:
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. ITC 2006: 1-10

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