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William Burchanowski

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2000 – 2009

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2006
[c2]
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Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar:
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. ITC 2006: 1-10
2005
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Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski:
A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. ITC 2005: 8

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