"valuating ATE Features in Terms of Test Escape Rates and Other Cost of ..."

John Gatej et al. (2002)

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DOI: 10.1109/TEST.2002.1041860

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns:
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ITC 2002: 1040-1049

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