"Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test."

David C. Keezer, R. J. Wenzel (1997)

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DOI: 10.1109/TEST.1997.639599

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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David C. Keezer, R. J. Wenzel:
Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ITC 1997: 94-100

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