"A Novel Low-Cost Approach to MCM Interconnect Test."

Bruce C. Kim et al. (1995)

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DOI: 10.1109/TEST.1995.529832

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel:
A Novel Low-Cost Approach to MCM Interconnect Test. ITC 1995: 184-192

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