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ORCIDBruce C. Kim
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2010 – 2019
- 2018
[c35]Bruce C. Kim, Sang-Bock Cho:
Design of 3D Inductors for IoT Security. ISOCC 2018: 251-252- 2017
- [j32]Saikat Mondal
, Sang-Bock Cho, Bruce C. Kim:
Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 308-318 (2017) - 2016
- [c34]Jin-Seong Jeong, Hyun-Tae Kim, Bruce C. Kim, Sang-Bock Cho:
Wide rear vehicle recognition using a fisheye lens camera image. APCCAS 2016: 691-693 - [c33]Hyun-Tae Kim, Jin-Seong Jeong, Bruce C. Kim, Sang-Bock Cho:
Text information acquisition method of traffic signs for autonomous navigation. APCCAS 2016: 727-729 - [c32]Bruce C. Kim, Sang-Bock Cho:
Recent advances in TSV inductors for 3D IC technology. ISOCC 2016: 29-30 - 2014
- [c31]Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian:
A novel BIST technique for LDMOS drivers. MWSCAS 2014: 1069-1072 - 2013
- [j31]Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi:
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29(6): 745-762 (2013) - [c30]Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho:
Development of hybrid electrical model for CNT based Through Silicon Vias. ISCAS 2013: 1022-1026 - [c29]Anurag Gupta, Mitchell Spryn, Bruce C. Kim, Eugene Edwards, Christina Brantley, Paul Ruffin:
Design of nanosensing platform based on zinc oxide nanowire arrays. ISCAS 2013: 2335-2338 - [c28]Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian:
Physics Based Fault Models for Testing High-Voltage LDMOS. VLSI Design 2013: 285-290 - 2012
- [j30]Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn:
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. J. Electron. Test. 28(1): 39-51 (2012) - [c27]Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho:
Modeling and characterization of CNT-based TSV for high frequency applications. ISCAS 2012: 1584-1589 - [c26]Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn:
Analysis of propagation delay in 3 - D stacked DRAM. ISCAS 2012: 1839-1842 - 2011
- [j29]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force:
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27(3): 241-252 (2011) - 2010
- [c25]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed:
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC 2010: 325-333
2000 – 2009
- 2009
- [c24]Sukeshwar Kannan, Bruce C. Kim:
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. ITC 2009: 1 - 2008
- [j28]Bruce C. Kim, Craig Force:
Guest Editors' Introduction: The Evolution of RFIC Design and Test. IEEE Des. Test Comput. 25(1): 6-8 (2008) - [j27]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 25(1): 103 (2008) - [j26]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 25(2): 198-199 (2008) - 2007
- [j25]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 24(1): 97 (2007) - [j24]Bruce C. Kim:
Test Technology TC Newsletter. IEEE Des. Test Comput. 24(2): 197 (2007) - [j23]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 24(3): 292 (2007) - [j22]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 24(4): 407 (2007) - [j21]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 24(5): 511 (2007) - [j20]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 24(6): 605 (2007) - [j19]Bruce C. Kim:
Test Technology Newsletter. J. Electron. Test. 23(1): 9-10 (2007) - [j18]Bruce C. Kim:
Test Technology Newsletter April 2007. J. Electron. Test. 23(2-3): 113-114 (2007) - [j17]Bruce C. Kim:
Test Technology Newsletter - October 2007. J. Electron. Test. 23(5): 371-372 (2007) - [j16]Bruce C. Kim:
Test Technology Newsletter - December 2007. J. Electron. Test. 23(6): 467-468 (2007) - [c23]Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall:
Low cost automatic mixed-signal board test using IEEE 1149.4. ITC 2007: 1-9 - 2006
- [j15]Bruce C. Kim, Yervant Zorian:
Guest Editors' Introduction: Big Innovations in Small Packages. IEEE Des. Test Comput. 23(3): 186-187 (2006) - [j14]Bruce C. Kim:
Test Technology Technical Council Newsletter. IEEE Des. Test Comput. 23(3): 250 (2006) - [j13]Bruce C. Kim:
Test Technology TC Newsletter. IEEE Des. Test Comput. 23(4): 320-323 (2006) - [j12]Bruce C. Kim:
Test Technology TC Newsletter. IEEE Des. Test Comput. 23(5): 425 (2006) - [j11]Bruce C. Kim:
TTTC Newsletter. IEEE Des. Test Comput. 23(6): 507 (2006) - [j10]Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla:
A Novel RF Test Scheme Based on a DFT Method. J. Electron. Test. 22(3): 229-237 (2006) - [j9]Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla:
A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE Trans. Instrum. Meas. 55(2): 381-388 (2006) - [c22]Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal:
DIBPro: Automatic Diagnostic Program Generation Tool. ITC 2006: 1-8 - [c21]Yervant Zorian, Bruce C. Kim:
Session Abstract. VTS 2006: 334-335 - 2005
- [j8]Bruce C. Kim:
Test Technology Technical Council Newsletter. J. Electron. Test. 21(2): 113-114 (2005) - [j7]Bruce C. Kim:
Test Technology Technical Council Newsletter. J. Electron. Test. 21(3): 201 (2005) - [j6]Bruce C. Kim:
The Newsletter of Test Technology Council of the IEEE Computer Society. J. Electron. Test. 21(5): 461-462 (2005) - [j5]Jee-Youl Ryu, Bruce C. Kim:
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electron. Test. 21(6): 571-581 (2005) - [j4]Jee-Youl Ryu, Bruce C. Kim:
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectron. J. 36(8): 770-777 (2005) - [c20]Rahim Kasim, Bruce C. Kim, Josef Drobnik:
Advanced Mems for High Power Integrated Distribution Systems. ICMENS 2005: 247-254 - 2004
- [c19]Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla:
A new BIST scheme for 5GHz low noise amplifiers. ETS 2004: 127-132 - [c18]Jee-Youl Ryu, Bruce C. Kim:
A new design for built-in self-test of 5GHz low noise amplifiers. SoCC 2004: 324-327 - 2003
- [j3]Kyung-Geun Lee, Hyoung-Kyu Song, Mi-Jeong Kim, Sang-Tae Kim, Bruce C. Kim, Young-Hwan You:
Impact of Parameter Imbalances on Transmit Diversity OFDM System Performance. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 86-A(8): 2168-2171 (2003) - [c17]Kranthi K. Pinjala, Bruce C. Kim:
An Approach for Selection of Test Points for Analog Fault Diagnosis. DFT 2003: 287-294 - [c16]Kee-Keun Lee, Bruce C. Kim:
RF MEMS Switch for Wireless LAN Applications. ICMENS 2003: 100-102 - [c15]Kee-Keun Lee, Bruce C. Kim:
MEMS Spring Probe for Next Generation Wafer Level Testing. ICMENS 2003: 214-217 - [c14]Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim:
Benzocyclobutene (BCB) Based Intracortical Neural Implant. ICMENS 2003: 418-422 - [c13]Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam:
Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC 2003: 403-409
1990 – 1999
- 1999
- [c12]Bruce C. Kim, Pinshan Jiang, Se Hyun Park:
A probe scheduling algorithm for MCM substrates. ITC 1999: 31-37 - [c11]Bruce C. Kim, Krishna Marella:
A Novel Test Methodology for MEMS Magnetic Micromotors. VTS 1999: 284-289 - 1998
- [c10]Bruce C. Kim, David C. Keezer, Abhijit Chatterjee:
A high throughput test methodology for MCM substrates. ITC 1998: 234-240 - [c9]Rongchang Yan, Bruce C. Kim:
A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob. VTS 1998: 266-273 - 1997
- [j2]Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee:
A Survey of Test Techniques for MCM Substrates. J. Electron. Test. 10(1-2): 27-38 (1997) - [c8]Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190 - 1996
- [j1]Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits. IEEE Des. Test Comput. 13(2): 26-33 (1996) - [c7]Bruce C. Kim, Hisao Fujikawa, Tetsuji Tamaka:
An integrated network management system: the design for AIN and B-ISDN. NOMS 1996: 604-607 - [c6]Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design 1996: 230-233 - [c5]Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan:
Low-cost diagnosis of defects in MCM substrate interconnections. VTS 1996: 260-265 - 1995
- [c4]Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel:
A Novel Low-Cost Approach to MCM Interconnect Test. ITC 1995: 184-192 - 1994
- [c3]Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel:
A Methodology for Generation and Collection of Multiprocessor Traces. MASCOTS 1994: 417-418 - 1992
- [c2]Philip W. Mathis, Bruce C. Kim:
Network Performance Monitoring And Fault Detection On The Gtnet. NOMS 1992: 579-585 - 1991
- [c1]Bruce C. Kim:
Defense data network management system. LCN 1991: 375-377
Coauthor Index
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