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"In Search of the Optimum Test Set - Adaptive Test Methods for Maximum ..."
Robert Madge et al. (2004)
- Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
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