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2000 – 2009
- 2007
[c21]Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian:
Making Manufacturing Work For You. DAC 2007: 107-108- 2005
- [j3]Robert Madge:
New test paradigms for yield and manufacturability. IEEE Des. Test Comput. 22(3): 240-246 (2005) - [c20]W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9 - [c19]Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware:
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9 - [c18]W. Robert Daasch, Robert Madge:
Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10 - [c17]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c16]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon
, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c15]Robert Madge:
New Test Paradigms for Yield and Manufacturability. ITC 2004: 13 - [c14]Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw:
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ITC 2004: 181-189 - [c13]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c12]Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 - [c11]Robert Madge:
ATE Value Add through Open Data Collection. ITC 2004: 1430 - [c10]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [j2]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003) - [c9]Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller:
Creating Value Through Test. DATE 2003: 10402-10409 - [c8]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c7]Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 - [c6]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46 - 2002
- [j1]W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19(5): 74-81 (2002) - [c5]David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471 - [c4]Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 - [c3]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240 - [c2]Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74 - 2001
- [c1]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100
Coauthor Index
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