"Hierarchical DFT with enhancements for AC scan, test scheduling and ..."

Jeff Remmers, Darin Lee, Richard Fisette (2005)

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DOI: 10.1109/TEST.2005.1584034

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jeff Remmers, Darin Lee, Richard Fisette:
Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study. ITC 2005: 9

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