"X-Masking During Logic BIST and Its Impact on Defect Coverage."

Yuyi Tang et al. (2004)

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DOI: 10.1109/TEST.2004.1386980

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker:
X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451

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