"Multi-GHz interface devices should be tested using external test resources."

Takahiro J. Yamaguchi (2002)

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DOI: 10.1109/TEST.2002.1041930

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Takahiro J. Yamaguchi:
Multi-GHz interface devices should be tested using external test resources. ITC 2002: 1229

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