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"Defining the performance of SiOx ReRAM by engineering oxide microstructure."
Anthony J. Kenyon et al. (2022)
- Anthony J. Kenyon, Adnan Mehonic, Wing H. Ng, Longfei Zhao, Horatio Cox, Mark Buckwell, Kamal Patel, Andrew P. Knights, Daniel J. Mannion, Alexander L. Shluger:
Defining the performance of SiOx ReRAM by engineering oxide microstructure. MOCAST 2022: 1-4
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