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"Random Testing of Multi-Port Static Random Access Memories."

Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi (2002)

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DOI: 10.1109/MTDT.2002.1029770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/mtdt/KarimiML02
Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi:
Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108

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