


default search action
"Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal."
- Senwei Xiang, Weimin Yang, Ting Wang:

Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal. ROBIO 2022: 1157-1161

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













