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"Generation of Tests for the Localization of Single Gate Design Errors in ..."
Raimund Ubar, Dominique Borrione (1998)
- Raimund Ubar, Dominique Borrione:
Generation of Tests for the Localization of Single Gate Design Errors in Combinational Circuits using the Stuck-at Fault Model. SBCCI 1998: 51-54
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