"Stress-based Electromigration Modeling in IC Design: Moving from Theory to ..."

Susann Rothe, Jens Lienig, Sachin S. Sapatnekar (2024)

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DOI: 10.1109/SMACD61181.2024.10745452

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-02

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Susann Rothe, Jens Lienig, Sachin S. Sapatnekar:
Stress-based Electromigration Modeling in IC Design: Moving from Theory to Practice. SMACD 2024: 1-4

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