"Analysis and solution to overcome EOS failure induced by latchup test in a ..."

Hui-Wen Tsai et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533803

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Hui-Wen Tsai, Ming-Dou Ker, Yi-Sheng Liu, Ming-Nan Chuang:
Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits. VLSI-DAT 2013: 1-4

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