"New techniques for selecting test frequencies for linear analog circuits."

Mohand Bentobache et al. (2013)

> Home

Details and statistics

DOI: 10.1109/VLSI-SOC.2013.6673256

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/BentobacheBEKM13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/BentobacheBEKM13
Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir:
New techniques for selecting test frequencies for linear analog circuits. VLSI-SoC 2013: 90-95

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.