"Minimizing Test Frequencies for Linear Analog Circuits: New Models and ..."

Mohand Bentobache et al. (2013)

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DOI: 10.1007/978-3-319-23799-2_9

access: open

type: Conference or Workshop Paper

metadata version: 2019-10-31

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Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Salvador Mir, Yann Kieffer:
Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods. VLSI-SoC (Selected Papers) 2013: 188-207

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