"Evaluating the Impact of Process Variability and Radiation Effects on ..."

Leonardo Heitich Brendler et al. (2018)

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DOI: 10.1109/VLSI-SOC.2018.8644828

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC 2018: 71-76

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