"Broadside Transition Test Generation for Partial Scan Circuits through ..."

Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara (2006)

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DOI: 10.1007/978-0-387-74909-9_17

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara:
Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation. VLSI-SoC (Selected Papers) 2006: 301-316

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