"Statistical analysis of systematic and random variability of flip-flop ..."

Gustavo Neuberger et al. (2007)

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DOI: 10.1109/VLSISOC.2007.4402476

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type: Conference or Workshop Paper

metadata version: 2025-03-03

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Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha:
Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies. VLSI-SoC 2007: 78-83

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