"Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield ..."

Maryam Ashouei et al. (2007)

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DOI: 10.1109/VLSID.2007.130

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit Chatterjee, Adit D. Singh, Abdulkadir Utku Diril:
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations. VLSI Design 2007: 711-716

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