"Test Pattern Generation and Compaction for Crosstalk Induced Glitches and ..."

Shehzad Hasan, Ajoy Kumar Palit, Walter Anheier (2010)

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DOI: 10.1109/VLSI.DESIGN.2010.30

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Shehzad Hasan, Ajoy Kumar Palit, Walter Anheier:
Test Pattern Generation and Compaction for Crosstalk Induced Glitches and Delay Faults. VLSI Design 2010: 345-350

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