"A Versatile BIST Technique Combining Test Registers and Accumulators."

Frank Mayer, Albrecht P. Stroele (2000)

> Home

Details and statistics

DOI: 10.1109/ICVD.2000.812642

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/MayerS00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/MayerS00
Frank Mayer, Albrecht P. Stroele:
A Versatile BIST Technique Combining Test Registers and Accumulators. VLSI Design 2000: 412-

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.