"Partial Reset Methodologies for Improving Random-Pattern Testability and ..."

Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee (1998)

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DOI: 10.1109/ICVD.1998.646602

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee:
Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits. VLSI Design 1998: 199-204

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