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"Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing."

Haripriya R. S, Soumitro Vyapari, Jaynarayan T. Tudu (2024)

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DOI: 10.1109/VLSID60093.2024.00126

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-08

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Haripriya R. S, Soumitro Vyapari, Jaynarayan T. Tudu:
Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing. VLSID 2024: 712-717

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