"Design for Strong Testability of RTL Data Paths to Provide Complete Fault ..."

Hiroki Wada et al. (2000)

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DOI: 10.1109/ICVD.2000.812625

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara:
Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. VLSI Design 2000: 300-305

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