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"Redundancy Removal and Test Generation for Circuits with Non-Boolean ..."

Srimat T. Chakradhar, Steven G. Rothweiler (1995)

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DOI: 10.1109/VTEST.1995.512611

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ChakradharR95
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ChakradharR95
Srimat T. Chakradhar, Steven G. Rothweiler:
Redundancy Removal and Test Generation for Circuits with Non-Boolean Primitives. VTS 1995: 12-19

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