"Diagnostic Test Generation for silicon diagnosis with an incremental ..."

Maheshwar Chandrasekar, Michael S. Hsiao (2009)

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DOI: 10.1109/HLDVT.2009.5340172

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Maheshwar Chandrasekar, Michael S. Hsiao:
Diagnostic Test Generation for silicon diagnosis with an incremental learning framework based on search state compatibility. HLDVT 2009: 68-75

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