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"Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test ..."
Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (2019)
- Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults. ISQED 2019: 284-290
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