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"On Complete Functional Broadside Tests for Transition Faults."

Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy (2008)

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DOI: 10.1109/TCAD.2008.915531

access: closed

type: Journal Article

metadata version: 2020-09-24

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Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy:
On Complete Functional Broadside Tests for Transition Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(3): 583-587 (2008)

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