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"An Overlapping Scan Architecture for Reducing Both Test Time and Test ..."
Xiaoding Chen, Michael S. Hsiao (2007)
- Xiaoding Chen, Michael S. Hsiao:
An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection. IEEE Trans. Very Large Scale Integr. Syst. 15(4): 404-412 (2007)
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