"The Devil is in the Details: Whole Slide Image Acquisition and Processing ..."

Neel Kanwal et al. (2022)

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DOI: 10.1109/ACCESS.2022.3176091

access: open

type: Journal Article

metadata version: 2022-06-28

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Neel Kanwal, Fernando Pérez-Bueno, Arne Schmidt, Kjersti Engan, Rafael Molina:
The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review. IEEE Access 10: 58821-58844 (2022)

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