"An Investigation of Frequency Dependent Reliability and Failure Mechanism ..."

Roshan L. Kini et al. (2020)

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DOI: 10.1109/ACCESS.2020.3011453

access: open

type: Journal Article

metadata version: 2023-09-30

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Roshan L. Kini, Shankar Dhakal, Sadab Mahmud, Andrew J. Sellers, Michael R. Hontz, Cheikh A. Tine, Raghav Khanna:
An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. IEEE Access 8: 137312-137321 (2020)

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