"An automatic defect-inspection method for optical isolators using image ..."

Tian Qiu et al. (2022)

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DOI: 10.1515/AUTO-2022-0039

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type: Journal Article

metadata version: 2024-03-25

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Tian Qiu, Zhiquan Lin, Chen Jung Tsai, Chi Shing Wong, Xin Zhang, Shuaiqi Liu, Honglong Ning:
An automatic defect-inspection method for optical isolators using image analysis. Autom. 70(7): 662-675 (2022)

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