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"Modeling a Verification Test System for Mixed-Signal Circuits."

David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff (2001)

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DOI: 10.1109/54.902823

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/BelloTK01
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  persistent URL:
  - https://dblp.org/rec/journals/dt/BelloTK01
David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Des. Test Comput. 18(1): 63-71 (2001)

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